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Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys
Crystallography Reports ( IF 0.7 ) Pub Date : 2020-05-27 , DOI: 10.1134/s1063774520020121
M. S. Kalienko , A. V. Volkov , A. V. Zhelnina

Abstract

The VST3331 titanium alloy in three structural states with different dispersities of the secondary α phase of titanium has been investigated by scanning electron microscopy and X-ray diffraction analysis. The possibility of using full-profile analysis of X-ray diffraction patterns for determining the size of titanium secondary α-phase crystallites has been estimated. It is demonstrated that the methods in use yield similar estimates of the average thickness of titanium secondary α-phase plates.


中文翻译:

使用全轮廓X射线分析估算高强度钛合金中次级α相的弥散度

摘要

通过扫描电子显微镜和X射线衍射分析研究了VST3331钛合金在三种结构状态下具有不同的钛次级α相分散性。已经估计了使用X射线衍射图的全轮廓分析来确定钛二次α相微晶尺寸的可能性。结果表明,所用方法对钛二次α相板的平均厚度有相似的估计。
更新日期:2020-05-27
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