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Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys
Crystallography Reports ( IF 0.7 ) Pub Date : 2020-05-27 , DOI: 10.1134/s1063774520020121 M. S. Kalienko , A. V. Volkov , A. V. Zhelnina
中文翻译:
使用全轮廓X射线分析估算高强度钛合金中次级α相的弥散度
更新日期:2020-05-27
Crystallography Reports ( IF 0.7 ) Pub Date : 2020-05-27 , DOI: 10.1134/s1063774520020121 M. S. Kalienko , A. V. Volkov , A. V. Zhelnina
Abstract
The VST3331 titanium alloy in three structural states with different dispersities of the secondary α phase of titanium has been investigated by scanning electron microscopy and X-ray diffraction analysis. The possibility of using full-profile analysis of X-ray diffraction patterns for determining the size of titanium secondary α-phase crystallites has been estimated. It is demonstrated that the methods in use yield similar estimates of the average thickness of titanium secondary α-phase plates.中文翻译:
使用全轮廓X射线分析估算高强度钛合金中次级α相的弥散度