Capacitors are ubiquitous in electronic devices and play a critical role in the devices' electromagnetic compatibility performance. The ageing of capacitors, due to intrinsic degradation mechanisms and external thermal and electrical stresses, has drawn a wide attention in the reliability field. The variations of the capacitance and equivalent series resistance are typically seen as representative for the ageing of capacitors, while the other parasitic parameters are usually neglected. In this study, a new full-parameter ageing modelling approach of capacitors is proposed based on complex impedance analysis. The ageing characteristics of all the proposed 7 parameters, including all parasitic parameters, are identified by carrying out an electrical overstress accelerated ageing test.

中文翻译：

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基于复阻抗分析的电容器全参数老化建模新方法

电容器在电子设备中无处不在，对设备的电磁兼容性能起着至关重要的作用。由于内在退化机制和外部热应力和电应力，电容器的老化引起了可靠性领域的广泛关注。电容和等效串联电阻的变化通常被视为电容器老化的代表，而其他寄生参数通常被忽略。在本研究中，基于复阻抗分析，提出了一种新的电容器全参数老化建模方法。所有提议的 7 个参数的老化特性，包括所有寄生参数，都通过执行电气过应力加速老化测试来确定。