Abstract Titanium diffusion in tungsten is an undesirable phenomenon that may cause the drop of mechanical and thermal fatigue properties of tungsten base material and components in future fusion reactors. To avoid such as problematic, the effectiveness of two different diffusion coatings, deposited onto W base materials by means of RF magnetron sputtering (Cr and V layers), has been studied to analyze its impact on the operative brazing aspects of the W–Eurofer joints. Coatings with two different thicknesses were deposited over tungsten base material prepared using different surface roughness (0.08 and 0.09 μm). The results indicated that Ti diffusion into tungsten base material after the brazing process was suppressed in all cases while the consecution of full metallic continuity was reached. However, both Cr and V layers were dissolved during the brazing process due to the high solubility of both elements into β-Ti. Mechanical properties of the joints dropped especially when Cr is used but a strength higher than 100 MPa was obtained in the case of using V layers.

中文翻译：

---

Cr 和 V 涂层对 W-Eurofer 钎焊接头中 W 基材的影响，用于熔合应用

摘要 钛在钨中的扩散是一种不良现象，可能导致未来聚变反应堆中钨基材料和部件的机械和热疲劳性能下降。为了避免此类问题，已经研究了通过射频磁控溅射（Cr 和 V 层）沉积在 W 基材上的两种不同扩散涂层的有效性，以分析其对 W-Eurofer 接头操作钎焊方面的影响. 在使用不同表面粗糙度（0.08 和 0.09 μm）制备的钨基材料上沉积两种不同厚度的涂层。结果表明，在达到完全金属连续性的同时，在所有情况下都抑制了钎焊过程后 Ti 扩散到钨基材中。然而，由于两种元素在 β-Ti 中的溶解度很高，因此在钎焊过程中 Cr 和 V 层都溶解了。特别是当使用 Cr 时，接头的机械性能下降，但在使用 V 层的情况下获得了高于 100 MPa 的强度。