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Dynamic Light Scattering Measurements for Soft Materials on Solid Substrates: Employing Evanescent-wave Illumination and Dark-field Collection with a High Numerical Aperture Microscope Objective.
Analytical Sciences ( IF 1.6 ) Pub Date : 2020-10-10 , DOI: 10.2116/analsci.20p068
Toshinori Morisaku 1 , Miki Sunada 2 , Atsushi Miyazaki 3 , Takaya Sakai 3 , Keiko Matsuo 3 , Hiroharu Yui 1, 2, 4
Affiliation  

We developed an instrument that allows us to measure dynamic light scattering from soft materials on solid substrates by avoiding strong background due to the reflection light from substrates. In the instrument, samples on substrates are illuminated by evanescent-light field and the resultant scattered light from the samples is collected with a dark-field optical configuration by employing a high numerical aperture microscope objective. We applied the instrument to measure the dynamic properties of supported lipid bilayers (SLBs), which have been widely utilized in industries as functional materials such as biosensors. From the time course of the scattered light from the SLBs, the power spectrum with the broad peak ranging from 10 to 20 kHz is observed. The use of the microscope objectives enables us to apply the instrument to future light scattering imaging for dynamic properties of soft materials supported on various substrates by combining with conventional microscope systems.

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中文翻译:

固体基质上软材料的动态光散射测量:采用倏逝波照明和高数值孔径显微镜物镜暗场收集。

我们开发了一种仪器,可以通过避免由于基材反射光而产生的强背景来测量固体基材上软材料的动态光散射。在该仪器中,基底上的样品由倏逝光场照明,并通过采用高数值孔径显微镜物镜通过暗场光学配置收集样品产生的散射光。我们应用该仪器来测量支撑脂质双层(SLB)的动态特性,该脂质双层已在工业中广泛用作生物传感器等功能材料。从 SLB 散射光的时间进程中,可以观察到具有 10 至 20 kHz 宽峰的功率谱。显微镜物镜的使用使我们能够将该仪器应用于未来的光散射成像,通过与传统显微镜系统相结合,研究各种基底上支撑的软材料的动态特性。

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更新日期:2020-10-28
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