The use of coherent X‐ray reflectivity to recover interfacial topography is described using model calculations for a 1D interface. The results reveal that the illuminated topography can be recovered directly from the measured reflected intensities. This is achieved through an analysis of the Patterson function, the Fourier transform of the scattering intensity (as a function of lateral momentum transfer, Q _//, at fixed vertical momentum transfer, Q _z ). Specifically, a second‐order Patterson function is defined that reveals the discrete set of separations and contrast factors (i.e. the product of changes in the effective scattering factor) associated with discontinuities in the effective interfacial topography. It is shown that the topography is significantly overdetermined by the measurements, and an algorithm is described that recovers the actual topography through a deterministic sorting of this information.

中文翻译：

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从相干X射线反射率直接恢复界面形貌：一维界面的模型计算。

使用一维界面的模型计算描述了使用相干X射线反射率恢复界面形貌。结果表明，可以直接从测量的反射强度中恢复照明的地形。这是通过分析Patterson函数，散射强度的傅立叶变换（作为固定的垂直动量传递Q _z的横向动量传递Q _//的函数）来实现的。具体来说，定义了一个二阶Patterson函数，该函数揭示了分离和对比度因子的离散集合（即有效散射因子变化的乘积）与有效界面形貌的不连续性相关。结果表明，地形被测量结果大大地确定了，并且描述了一种算法，该算法通过对这些信息进行确定性排序来恢复实际的地形。