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About complexity of the 2.16-eV absorption band in MgO crystals irradiated with swift Xe ions
Radiation Measurements ( IF 2 ) Pub Date : 2020-07-01 , DOI: 10.1016/j.radmeas.2020.106379
G. Baubekova , A. Akilbekov , A.I. Popov , E. Shablonin , E. Vasil'chenko , M. Zdorovets , A. Lushchik

Abstract The precise study of the accumulation and subsequent thermal annealing of the defects responsible for the complex absorption band around 2.16 eV, being under discussion in the literature for a long time, has been performed in highly pure MgO single crystals exposed to 0.23-GeV 132Xe ions with a fluence of Φ = 5 × 1011 − 3.3 × 1014 ions/cm2. Three Gaussian components with the maxima at 2.16, 2.02 and 2.40 eV have been considered as a measure of so-called D1, D2 and D3 defects. Similar to the F and F+ centers, the concentration of these defects increases at high fluences without saturation marks, thus confirming their radiation-induced nature (involvement of novel Frenkel defects). The accumulation of D1 and the first stage of D-type defect annealing up to 700 K occurs similarly to single F-type centers, while the following increasing stage for D2,3 starts above 700 K; their concentration reaches the maximum at 900 K (practically plateau is seen in this temperature region for D1) and complete annealing of the D-type defects proceeds at 1100 K. Behavior of the D1 defects (accumulation rate, annealing kinetic at high temperatures) clearly differs from that for other D-type defects (especially D2). In our opinion, the D1 defects are high-order aggregates of anion vacancies (and not the anion vacancy dimers), while the involvement of additional structural defects into the D2,3 defects is suggested.

中文翻译:

关于 MgO 晶体中 2.16-eV 吸收带的复杂性,快速 Xe 离子辐照

摘要 在暴露于 0.23-GeV 132Xe 的高纯 MgO 单晶中进行了长期在文献中讨论的 2.16 eV 附近复杂吸收带缺陷的积累和随后的热退火的精确研究。 Φ = 5 × 1011 − 3.3 × 1014 离子/cm2 的离子。最大值为 2.16、2.02 和 2.40 eV 的三个高斯分量被认为是所谓的 D1、D2 和 D3 缺陷的度量。与 F 和 F+ 中心类似,这些缺陷的浓度在没有饱和标记的高通量下增加,从而证实了它们的辐射诱导性质(涉及新的 Frenkel 缺陷)。D1 的积累和高达 700 K 的 D 型缺陷退火的第一阶段与单个 F 型中心类似,而 D2,3 的以下增加阶段开始于 700 K 以上;它们的浓度在 900 K 时达到最大值(在 D1 的这个温度区域实际上可以看到平台)并且 D 型缺陷的完全退火在 1100 K 进行。 D1 缺陷的行为(积累率,高温下的退火动力学)清楚不同于其他 D 型缺陷(尤其是 D2)。在我们看来,D1 缺陷是阴离子空位的高阶聚集体(而不是阴离子空位二聚体),而建议将额外的结构缺陷纳入 D2,3 缺陷。高温下的退火动力学)明显不同于其他 D 型缺陷(尤其是 D2)。在我们看来,D1 缺陷是阴离子空位的高阶聚集体(而不是阴离子空位二聚体),而建议将额外的结构缺陷纳入 D2,3 缺陷。高温下的退火动力学)明显不同于其他 D 型缺陷(尤其是 D2)。在我们看来,D1 缺陷是阴离子空位的高阶聚集体(而不是阴离子空位二聚体),而建议将额外的结构缺陷纳入 D2,3 缺陷。
更新日期:2020-07-01
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