In this paper, four different equivalent circuit models to describe substrate loading effect in GaN HEMT on Si substrate are investigated. The effect is characterized by Z-parameter measurements of open de-embedding structure for 16 × 200-μm GaN HEMT on Si substrate. The grey wolf optimization (GWO)-based procedure is developed to extract optimal values for the model elements. The performance of the proposed technique is evaluated by using two other meta-heuristic optimizations, the well-known particle swarm and the recently developed whale algorithm. The three extraction procedures are evaluated in terms of their effectiveness and rate of convergences. The models are validated by means of S-parameters simulation for the considered device at different passive and active bias conditions. A very good agreement with measurements is achieved when using the GWO, validating its applicability for small- and large-signal modeling applications.

中文翻译：

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基于灰狼算法的GaN HEMT中衬底加载建模

本文研究了四种不同的等效电路模型来描述GaN HEMT在Si衬底上的衬底负载效应。效果的特点是Z硅衬底上16×200μmGaN HEMT的开放式去嵌入结构的大参数测量。开发了基于灰太狼优化（GWO）的过程，以提取模型元素的最佳值。通过使用其他两个元启发式优化方法（即著名的粒子群算法和最近开发的鲸鱼算法）来评估所提出技术的性能。对三种提取程序的有效性和收敛速度进行了评估。这些模型通过S参数仿真针对所考虑的器件在不同的被动和主动偏置条件下进行了验证。使用GWO时，可以与测量取得很好的一致性，从而验证了其在小信号和大信号建模应用中的适用性。