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Improvements of 6S Look-Up-Table Based Surface Reflectance Employing Minimum Curvature Surface Method
Asia-Pacific Journal of Atmospheric Sciences ( IF 2.3 ) Pub Date : 2020-01-08 , DOI: 10.1007/s13143-019-00164-3
Kyeong-Sang Lee , Chang Suk Lee , Minji Seo , Sungwon Choi , Noh-Hun Seong , Donghyun Jin , Jong-Min Yeom , Kyung-Soo Han

We propose a methodology employing an interpolation technique on the Second Simulation of a Satellite Signal (6S) look-up table (LUT) to improve surface reflectance retrieval using Himawari-8/Advanced Himawari Imager (AHI). A minimum curvature surface (MCS) technique was used to refine the 6S LUT, and the solar zenith angle (SZA) and viewing zenith angle (VZA) increments were narrowed by 0.5°. The interpolation processing time was relatively short, about 3172 s per channel, and the interpolated xa and xb were well represented by the changes in SZA and VZA. An evaluation of the interpolated xa and xb for six cases revealed a relative mean absolute error of less than 5% for all channels and cases; however, a slight difference was evident for higher values of SZA and VZA. To evaluate the surface reflectance, we compared the surface reflectance derived using 6S LUT with that calculated using 6S only. Application of the interpolated 6S LUT showed a lower relative root mean square error (RRMSE) of 0.65% to 9.29% for all channels, than before interpolation. The improvement in surface reflectance measurements increased with the SZA. For a SZA above 75°, the RRMSE improved significantly for all channels (by 11.33–45.1%). In addition, when the MCS method was applied, the surface reflectance measurements improved without spatial discontinuity and showed good agreement with 6S results in a linear profile analyses. Thus, the method proposed can improve LUT based surface reflectance measurements in less time and increase the availability of surface reflectance data based on geostationary satellites.

中文翻译:

最小曲率曲面法改进基于6S查找表的表面反射率

我们提出了一种在卫星信号(6S)查找表(LUT)的第二次模拟中采用插值技术的方法,以改进使用Himawari-8 /高级Himawari成像仪(AHI)的表面反射率检索。最小曲率表面(MCS)技术用于完善6S LUT,太阳天顶角(SZA)和观察天顶角(VZA)的增量缩小了0.5°。内插处理时间相对较短,每通道约3172 s,并且内插xaxb可以通过SZA和VZA的变化很好地表示。插值xaxb的求值六例病例显示所有通道和病例的相对平均绝对误差均小于5%;但是,较高的SZA和VZA值存在细微差别。为了评估表面反射率,我们将使用6S LUT得出的表面反射率与仅使用6S计算得到的表面反射率进行了比较。插值6S LUT的应用显示,所有通道的相对均方根误差(RRMSE)均比插值前低0.65%至9.29%。使用SZA可以提高表面反射率的测量值。对于高于75°的SZA,所有通道的RRMSE都有显着提高(提高了11.33–45.1%)。此外,当应用MCS方法时,表面反射率测量得到改善,没有空间不连续性,并且在线性轮廓分析中显示与6S的一致性很好。从而,
更新日期:2020-01-08
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