Abstract Atomic force microscope (AFM), as a type scanning probe microscope (SPM), offers advantages that include high resolution, real-time analysis, in-situ imaging, few environmental restrictions, and simple operation. So far, AFM has been applied to a wide variety of scientific fields. This paper reviews several advanced research results using AFM in the micro-nano science community to operate in the four main areas of materials, semiconductor industry, polymers, and medicine, and summarizes their methods and related technologies. While reviewing their findings, this paper also illustrates the advantages of using AFM-based methods compared to previous procedures. Finally, the conclusion projects the future development, challenges and opportunities of AFM. This paper provides guidance on the use of AFM for nano-manipulation and promotes the development of AFM in new fields.

中文翻译：

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原子力显微镜在材料、半导体、聚合物和医学中的应用：小综述

摘要 原子力显微镜（AFM）作为一种扫描探针显微镜（SPM），具有分辨率高、分析实时、原位成像、环境限制少、操作简单等优点。迄今为止，AFM 已应用于广泛的科学领域。本文回顾了微纳米科学界利用AFM在材料、半导体工业、聚合物和医学四大领域运作的几项先进研究成果，并总结了它们的方法和相关技术。在回顾他们的发现的同时，本文还说明了使用基于 AFM 的方法与以前的程序相比的优势。最后，结语对AFM未来的发展、挑战和机遇进行了展望。