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Novel Applications of FIB-SEM-Based ToF-SIMS in Atom Probe Tomography Workflows
Microscopy and Microanalysis ( IF 2.8 ) Pub Date : 2020-03-09 , DOI: 10.1017/s1431927620000136 William D A Rickard 1 , Steven M Reddy 2 , David W Saxey 1 , Denis Fougerouse 2 , Nicholas E Timms 2 , Luke Daly 2, 3, 4 , Emily Peterman 5 , Aaron J Cavosie 2 , Fred Jourdan 1, 2
中文翻译:
基于 FIB-SEM 的 ToF-SIMS 在原子探针断层扫描工作流程中的新应用
更新日期:2020-03-09
Microscopy and Microanalysis ( IF 2.8 ) Pub Date : 2020-03-09 , DOI: 10.1017/s1431927620000136 William D A Rickard 1 , Steven M Reddy 2 , David W Saxey 1 , Denis Fougerouse 2 , Nicholas E Timms 2 , Luke Daly 2, 3, 4 , Emily Peterman 5 , Aaron J Cavosie 2 , Fred Jourdan 1, 2
Affiliation
中文翻译:
基于 FIB-SEM 的 ToF-SIMS 在原子探针断层扫描工作流程中的新应用