A concept for the traceable calibration of magneto-optical indicator film (MOIF) based magnetic field imaging devices is presented and discussed for the example of a commercial MOIF device with a 60 × 45 mm 2 sensor. The calibration facilitates a quantitative and fast characterization of magnetic microstructures combining relatively high spatial resolution with large imaging areas. The macroscopic calibration is performed using the homogeneous magnetic stray field of a pre-characterized electromagnet with a large pole shoe diameter of 250 mm. However, this calibration alone cannot yet account for the vectorial and spatially fast decaying stray fields of magnetic microstructures. For that, a forward simulation approach is pursued, based on the temperature-dependent magnetic parameters of the MOIF material as resulting from superconducting quantum interference device magnetometry and ferromagnetic resonance measurements. This is complemented by a transfer function-based ...

中文翻译：

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磁光指示膜装置的非均匀场校准

针对具有60×45 mm 2传感器的商用MOIF设备的示例，提出并讨论了基于磁光指示膜（MOIF）的磁场成像设备的可追溯校准概念。校准有助于对磁性微结构进行定量和快速表征，将相对较高的空间分辨率与较大的成像面积结合在一起。宏观校准是使用具有250 mm大极靴直径的预特征化电磁体的均匀杂散磁场进行的。然而，仅此校准尚不能解决磁性微结构的矢量和空间快速衰减的杂散场。为此，我们追求一种前向仿真方法，基于MOIF材料的温度相关磁参数，该参数是由超导量子干涉仪的磁力测量和铁磁共振测量得出的。这是基于传递函数的补充。