We theoretically study the escape rate of S → R switching (from superconducting S state to resistive R state) in Josephson junction (JJ) formed by s-wave single-band (SB) and two-band (TB) superconductors (SB/TB junctions). The escape rate is calculated in terms of effective critical current in thermal activation (TA) and macroscopic quantum tunneling (MQT) regimes. It was shown that escape rate can exhibit qualitative features in the case of s_+--wave symmetry in TB superconductors, while s₊₊-wave is identical to JJ between SB s-wave superconductors. Leggett modes in TB superconductors lead to enhancement of escape rate in two-channel JJ in comparison with single-channel junctions.

我们从理论上研究了由s波单波段（SB）和两波段（TB）超导体（SB / TB）形成的约瑟夫森结（JJ）中S  →  R转换的逸出率（从超导S状态到电阻性R状态）路口）。根据热激活（TA）和宏观量子隧穿（MQT）方案中的有效临界电流来计算逃逸率。结果表明，在TB超导体中s _+-波对称的情况下，逸出率可以表现出定性特征，而s s ₊波与SB s波超导体之间的JJ相同。与单通道结相比，TB超导体中的Leggett模式导致两通道JJ的逸出率提高。