Cross sections for target Ar K-shell ionization associated with single and double electron capture, as well as the same cross sections corresponding to projectile F K X-rays and the total cross sections for single and double capture, were determined for 1.8–2.2 MeV/u ${\mathrm{F}}^{9+,8+,7+}$ projectiles. This work was performed at Western Michigan University using the tandem Van de Graaff accelerator. Coincidences between emitted X-rays and their corresponding charge-changed particles were detected. The Ar K X-ray coincidence cross section ratios for double to single capture are found to depend strongly on the incident charge state, with the ratios for ${\mathrm{F}}^{9+}$ well exceeding unity. Possible explanations for this anomalous behavior are discussed but a conclusive explanation is not found. The results are compared to previous experiments using fully-stripped fluorine where coincidence techniques were not employed.

确定了与单电子和双电子俘获有关的目标Ar K壳电离的横截面，以及对应于射弹FK X射线的相同横截面以及单和双俘获的总横截面，确定为1.8–2.2 MeV / ü ${\mathrm{F}}^{9+，8+，7+}$弹丸。这项工作是在西密歇根大学使用串联的Van de Graaff加速器完成的。检测到发射的X射线与其相应的电荷变化粒子之间的符合性。发现两次捕获到单次捕获的Ar K X射线符合横截面比率在很大程度上取决于入射电荷状态，其中比率为${\mathrm{F}}^{9+}$远远超过团结。讨论了有关此异常行为的可能解释，但未找到结论性解释。将结果与未使用巧合技术的使用全剥离氟的先前实验进行比较。