Superconducting transition-edge sensors (TESs) are highly sensitive detectors. Based on the outstanding performance on spectral resolution, the X-ray integral field unit (X-IFU) instrument on-board athena will be equipped with a large array of TES-based microcalorimeters. For optimal performance in terms of the energy resolution, it is essential to limit undesirable nonlinearity effects in the TES detector. Weak-link behavior induced on the TES by superconducting leads is such a nonlinearity effect. We designed and fabricated smart test structures to study the effect of the superconducting leads on the intrinsic transition curve of our TiAu-based TES bilayer. We measured and analyzed the resistance versus temperature transition curves of the test structures. We found relations of long-distance proximity effects with TES length and different lead materials. Based on these results, we can redesign and further optimize our TES-based X-ray detectors.

中文翻译：

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研究 TES 检测器转换曲线以优化频分复用读出的像素设计

超导过渡边缘传感器 (TES) 是高度灵敏的探测器。基于其出色的光谱分辨率性能，雅典娜舰载X射线积分场单元（X-IFU）仪器将配备大量基于TES的微量热仪。为了获得能量分辨率方面的最佳性能，必须限制 TES 检测器中不良的非线性效应。超导引线在 TES 上引起的弱连接行为就是这样一种非线性效应。我们设计并制造了智能测试结构，以研究超导引线对我们基于 TiAu 的 TES 双层本征跃迁曲线的影响。我们测量并分析了测试结构的电阻与温度转变曲线。我们发现了远距离邻近效应与 TES 长度和不同铅材料的关系。基于这些结果，我们可以重新设计并进一步优化基于 TES 的 X 射线探测器。