A diffused interface between a ceramic coating and a metallic substrate is expected to signify a more solid bonding. In addition to depth profiling, a novel 3D view and imaging approach based on ToF‐SIMS analysis was developed to investigate the diffused species around the interface. The diffusion of Al species in a Cr₂AlC ceramic coating and Zircaloy substrate system was investigated in both the as‐deposited and postannealed states. In terms of the 3D view and imaging of CsAl⁺ after Gaussian convolution, Al species visibly diffused into the substrate after annealing at 800°C for only 5 minutes compared with that in the as‐deposited sample.

中文翻译：

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Cr2AlC涂层与锆合金基底之间界面扩散的3D ToF‐SIMS视图

预计陶瓷涂层和金属基材之间的扩散界面将表示更牢固的结合。除了深度剖析外，还开发了一种基于ToF-SIMS分析的新颖3D视图和成像方法来研究界面周围的扩散物种。在沉积状态和退火后状态下，都研究了Al物种在Cr ₂ AlC陶瓷涂层和Zircaloy基底系统中的扩散。就高斯卷积后的CsAl ⁺的3D视图和成像而言，与沉积样品相比，Al物种在800°C退火仅5分钟后可见地扩散到了基底中。