Lock-in thermography (LIT) is a dynamic variant of infrared thermography, where local heat sources are periodically pulsed and amplitude and phase images of the surface temperature modulation are obtained. If used in electronic device testing, this method enables the localization of very weak local heat sources below the surface. This contribution reviews the basics and application of LIT for local efficiency analysis of solar cells and for failure analysis in other electronic components like bare and encapsulated integrated circuits. In both application fields LIT has established as a reliable and easy-to-use standard method for failure analysis.

中文翻译：

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锁定式热成像技术，用于分析太阳能电池和其他电子组件中的故障分析

锁定热成像（LIT）是红外热成像的动态变体，其中周期性地对局部热源进行脉冲控制，并获得表面温度调制的幅度和相位图像。如果用于电子设备测试中，此方法可以将非常弱的局部热源定位在表面以下。本文对LIT的基础知识和应用进行了综述，以用于太阳能电池的局部效率分析以及其他电子组件（如裸露和封装的集成电路）的故障分析。在这两个应用领域中，LIT已被确立为一种可靠且易于使用的故障分析标准方法。