当前位置: X-MOL 学术Crystallogr. Rep. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
New Approaches to Precise Measurements of Electron Diffraction Patterns
Crystallography Reports ( IF 0.7 ) Pub Date : 2020-04-07 , DOI: 10.1134/s1063774520020145
A. K. Kulygin , K. V. Kulygin , A. S. Avilov

Abstract

To increase the measurement precision of electron diffraction patterns, a deep upgrade of EMR-102 diffractometer is performed, its operation parameters are studied, and a single-electron detection system with high temporal resolution (up to 60 MHz) and high spatial resolution (several tens of thousands of pixels per 1 Å–1) is elaborated. A special software is developed to control the experiment (in particular, using deflection coils and applying synchronous detection of temporal and spatial parameters of each event of electron detector response) and process experimental data. The upgraded diffractometer was used in a series of precise electron diffraction studies, where the accuracy in measuring relative intensities and spatial (angular) resolution were much better than in similar experiments described in the literature.


中文翻译:

精确测量电子衍射图的新方法

摘要

为了提高电子衍射图的测量精度,对EMR-102衍射仪进行了深层升级,研究了其工作参数,并建立了具有高时间分辨率(高达60 MHz)和高空间分辨率(几个)的单电子检测系统。每1Å 1数万个像素)。开发了一种特殊的软件来控制实验(特别是使用偏转线圈并同步检测每个电子探测器响应事件的时空参数)并处理实验数据。升级版衍射仪用于一系列精确的电子衍射研究中,其中相对强度和空间(角度)分辨率的测量精度比文献中描述的类似实验要好得多。
更新日期:2020-04-07
down
wechat
bug