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Modified Calibration Coefficients of Two-Port CPW Standards with Superstrate Effects
MAPAN ( IF 1 ) Pub Date : 2019-09-24 , DOI: 10.1007/s12647-019-00348-2
Kamlesh Patel , Paramjeet Singh , Sandhya M. Patel , V. N. Ojha

Calibration standards are used for the calibration of a vector network analyzer to characterize the microwave components under test. For the direct characterization of coplanar waveguide components, two-port CPW open, short and line are proposed to complement the existing calibration techniques. The developed CPW standards are characterized in the frequency range of 10 MHz to 10 GHz. As these are planar structures, effects of small superstrates on the calibration coefficients of open and short are studied also. The CPW line has shown slight changes in impedance due to superstrates, whereas a few calibration coefficients of open and short standards showed dependence on superstrates. Similar observations are noted by improving the polynomial models of CPW open and short standards up to fifth and sixth order, respectively, which better matches for CPW standards. The reported results are helpful to estimate any change in the measurement uncertainty on using such calibration standards due to superstrates.

中文翻译:

具有叠加效应的两端口CPW标准的修正校准系数

校准标准用于矢量网络分析仪的校准,以表征被测微波组件。为了直接表征共面波导组件,提出了两端口CPW开路,短路和线路来补充现有的校准技术。已开发的CPW标准的特征在于10 MHz至10 GHz的频率范围。由于这些是平面结构,因此还研究了小覆盖层对开路和短路校准系数的影响。CPW线显示出由于覆盖层而引起的阻抗的微小变化,而一些开放标准和短期标准品的校准系数显示出对覆盖层的依赖性。通过将CPW开放标准和短期标准的多项式模型分别提高到五阶和六阶,可以注意到类似的观察结果,与CPW标准更好地匹配。报告的结果有助于估计由于使用过厚的校准标样而导致的测量不确定度的任何变化。
更新日期:2019-09-24
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