当前位置: X-MOL 学术Appl. Phys. B › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
On the performance of wavelength meters: Part 2—frequency-comb based characterization for more accurate absolute wavelength determinations
Applied Physics B ( IF 2.1 ) Pub Date : 2020-04-21 , DOI: 10.1007/s00340-020-07433-4
Kristian König , Phillip Imgram , Jörg Krämer , Bernhard Maaß , Konstantin Mohr , Tim Ratajczyk , Felix Sommer , Wilfried Nörtershäuser

Wavelength meters are widely used for frequency determinations and stabilization purposes since they cover a large wavelength range, provide a high read-out rate and have specified accuracies of up to $$10^{-8}$$ 10 - 8 . More accurate optical frequency measurements can be achieved with frequency combs but only at the price of considerably higher costs and complexity. In the context of precise and accurate frequency determinations for high-resolution laser spectroscopy, the performance of five different wavelength meters was quantified with respect to a frequency comb. The relative precision as well as the absolute accuracy has been investigated in detail, allowing us to give a sophisticated uncertainty margin for the individual instruments. We encountered a prominent substructure on the deviation between both device types with an amplitude of a few MHz that is repeating on the GHz scale. This finally limits the precision of laser scans which are monitored and controlled with wavelength meters. While quantifying its uncertainty margins, we found a high temporal stability in the characteristics of the wavelength meters which enables the preparation of wavelength-dependent adjustment curves for wide- and short-ranged scans. With this method, the absolute accuracy of wavelength meters can be raised up to the MHz level independently from the wavelength of the reference laser used for calibrating the device. Since this technique can be universally applied, it can lead to benefits in all fields of wavelength meter applications.

中文翻译:

关于波长计的性能:第 2 部分 — 基于频率梳的表征,可更准确地确定绝对波长

波长计广泛用于频率确定和稳定目的,因为它们覆盖大波长范围,提供高读出率并且具有高达 $10^{-8}$$10 - 8 的指定精度。使用频率梳可以实现更精确的光频测量,但代价是成本和复杂性要高得多。在高分辨率激光光谱精确和准确的频率确定的背景下,五个不同波长计的性能相对于频率梳进行了量化。详细研究了相对精度和绝对精度,使我们能够为各个仪器提供复杂的不确定性余量。我们在两种设备类型之间的偏差上遇到了一个突出的子结构,幅度为几 MHz,在 GHz 范围内重复。这最终限制了由波长计监测和控制的激光扫描的精度。在量化其不确定性余量的同时,我们发现波长计的特性具有很高的时间稳定性,这使得为宽范围和短程扫描准备与波长相关的调整曲线成为可能。使用这种方法,波长计的绝对精度可以提高到 MHz 级,独立于用于校准设备的参考激光的波长。由于该技术可以普遍应用,因此它可以在波长计应用的所有领域中受益。这最终限制了由波长计监测和控制的激光扫描的精度。在量化其不确定性余量的同时,我们发现波长计的特性具有很高的时间稳定性,这使得为宽范围和短程扫描准备与波长相关的调整曲线成为可能。使用这种方法,波长计的绝对精度可以提高到 MHz 级,独立于用于校准设备的参考激光的波长。由于该技术可以普遍应用,因此它可以在波长计应用的所有领域中受益。这最终限制了由波长计监测和控制的激光扫描的精度。在量化其不确定性余量的同时,我们发现波长计的特性具有很高的时间稳定性,这使得为宽范围和短程扫描准备与波长相关的调整曲线成为可能。使用这种方法,波长计的绝对精度可以提高到 MHz 级,独立于用于校准设备的参考激光的波长。由于这项技术可以普遍应用,因此它可以为波长计应用的所有领域带来好处。我们发现波长计的特性具有很高的时间稳定性,这使得可以为宽范围和短程扫描准备与波长相关的调整曲线。使用这种方法,波长计的绝对精度可以提高到 MHz 级,独立于用于校准设备的参考激光的波长。由于该技术可以普遍应用,因此它可以在波长计应用的所有领域中受益。我们发现波长计的特性具有很高的时间稳定性,这使得可以为宽范围和短程扫描准备与波长相关的调整曲线。使用这种方法,波长计的绝对精度可以提高到 MHz 级,独立于用于校准设备的参考激光的波长。由于该技术可以普遍应用,因此它可以在波长计应用的所有领域中受益。
更新日期:2020-04-21
down
wechat
bug