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Two-Dimensional Vector Micro-Displacement Measurement Based on Fiber Mode Demodulation Technology
IEEE Transactions on Instrumentation and Measurement ( IF 5.6 ) Pub Date : 2020-05-01 , DOI: 10.1109/tim.2019.2921054
Hai-Feng Hu , Feng Xia , Yong Zhang , Han Gao

This paper presents a 2-D vector microdisplacement sensor based on mode coupling between single-mode fiber (SMF) and two-mode fiber (TMF). The offset alignment between SMF and TMF along the radial direction of optical fibers can influence the mode coefficients of LP01 mode, LP11o mode, and LP11e mode in TMF, including mode power proportion coefficients and mode relative phase coefficients. Modal decomposition based on digital holography is used for obtaining these mode coefficients. The variations of mode coefficients of all modes in TMF with the change of the offset between SMF and TMF (i.e., microdisplacement) in two vertical directions are simulated. Experimental results are consistent with simulation results, displaying that the microdisplacement in the range from −5 to $5~\mu \text{m}$ along the positive or negative $x$ -axis or $y$ -axis direction can be judged by using the proposed scheme based on mode demodulation technology.

中文翻译:

基于光纤模式解调技术的二维矢量微位移测量

本文提出了一种基于单模光纤 (SMF) 和双模光纤 (TMF) 之间模式耦合的二维矢量微位移传感器。SMF 和 TMF 之间沿光纤径向的偏移对准会影响 LP 01模式、LP 11o模式和 LP 11e模式的模式系数TMF中的模式,包括模式功率比例系数和模式相对相位系数。使用基于数字全息的模态分解来获得这些模态系数。模拟了 TMF 中所有模式的模式系数随 SMF 和 TMF 之间的偏移量(即微位移)在两个垂直方向上的变化。实验结果与模拟结果一致,表明在−5 到 $5~\mu \text{m}$ 沿着正面或负面 $x$ -轴或 $y$ 使用所提出的基于模式解调技术的方案可以判断-轴方向。
更新日期:2020-05-01
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