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X‐ray scattering and polarization in wavelength‐dispersive spectrometers
X-Ray Spectrometry ( IF 1.2 ) Pub Date : 2020-03-09 , DOI: 10.1002/xrs.3142
Batobolot Zhalsaraevich Zhalsaraev 1
Affiliation  

Background suppression is discussed in wavelength‐dispersive polarization X‐ray spectrometer (WDPXRS), in which the goniometer scans in plane perpendicular to primary and secondary beams. Background suppression coefficients in WDPXRS and energy‐dispersive polarization X‐ray spectrometer are determined by different expressions (in “The scattering suppression of X‐rays with energy of 20–200 keV in spectrometers with Barkla polarizers,” doi: 10.1002/xrs.3046). It is proposed to install silicon drift detectors in WDPXRS and implement energy‐dispersive and wavelength‐dispersive modes in one channel.

中文翻译:

波长色散仪中的X射线散射和偏振

在波长色散偏振X射线光谱仪(WDPXRS)中讨论了背景抑制,其中测角仪在垂直于主光束和副光束的平面中进行扫描。WDPXRS和能量色散偏振X射线光谱仪中的背景抑制系数由不同的表达式确定(在“带Barkla偏振器的光谱仪中能量为20-200 keV的X射线的散射抑制”,doi:10.1002 / xrs.3046 )。建议在WDPXRS中安装硅漂移检测器,并在一个通道中实现能量分散和波长分散模式。
更新日期:2020-03-09
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