当前位置: X-MOL 学术X-Ray Spectrom. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Review on applications of synchrotron‐based X‐ray techniques in materials characterization
X-Ray Spectrometry ( IF 1.2 ) Pub Date : 2020-03-01 , DOI: 10.1002/xrs.3141
Pooria Sedigh Rahimabadi 1 , Mehdi Khodaei 1 , Kaveenga R. Koswattage 2
Affiliation  

Synchrotron radiation (SR), as a result of its high‐intensity, brilliant, monochromatic, and collimated beams, is becoming one of the most crucial components of research in various fields of materials science such as nanomaterials, biomaterials, and energy materials. SR‐based characterization methods can be employed to analyze different systems such as powders, thin films, and bulk forms having complex crystalline or amorphous structures. In this review, peculiarities of SR are briefly explained. Moreover, various techniques carried out utilizing this instrument for material characterization such as X‐ray powder diffraction, grazing‐incidence X‐ray diffraction, small/wide‐angle X‐ray scattering, X‐ray absorption spectroscopy, different techniques of X‐ray imaging, X‐ray photoelectron spectroscopy, and X‐ray microprobes/nanoprobes are presented. As a result, by shedding light on the advantages of SR and its superiority to the equivalent laboratory experiments, researchers are recommended to exploit the capabilities of this invaluable tool in their materials characterization.

中文翻译:

回顾基于同步加速器的X射线技术在材料表征中的应用

同步辐射(SR)由于具有高强度,明亮,单色和准直的光束,正成为材料科学各个领域(如纳米材料,生物材料和能源材料)研究中最关键的组成部分之一。基于SR的表征方法可用于分析不同的系统,例如粉末,薄膜和具有复杂晶体或非晶结构的块状形式。在这篇综述中,简述了SR的特性。此外,利用该仪器进行的各种材料表征技术,例如X射线粉末衍射,掠入射X射线衍射,小/广角X射线散射,X射线吸收光谱法,不同的X射线技术介绍了成像,X射线光电子能谱和X射线微探针/纳米探针。
更新日期:2020-03-01
down
wechat
bug