Electromagnetic pulse (EMP)-induced nonlinear degradation of an L-band gallium arsenide-based low-noise amplifier (LNA) is studied by an injection experiment, failure analysis, and mixed-mode simulation. The experimental results indicate that the real-time response, radio frequency, and direct current characteristic of LNA samples under an EMP show nonlinear and permanent degradation features. In detail, the characteristics first degrade and then recover slightly as the injection power increases. In addition, the nonlinear degradation shows a close dependence on the pulse properties. Failure analysis reveals that the degradation of the LNA is attributed to latent failure defects under and around the gate metal strip of the first-stage high electron mobility transistor, with recovery well interpreted by an EMP-induced “annealing effect.” Simulation results show that if the pulse repetition frequency is smaller than 2.5 kHz, a pulse repetition-induced thermal accumulation effect will not occur and that the pulsewidth τ will mainly determine the actual action duration and the temperature of the “annealing effect.” Based on the above mechanism, the dependence of the pulse properties on nonlinear degradation is well explained.

中文翻译：

---

GaAs基低噪声放大器在电磁脉冲注入下的非线性和永久退化

通过注入实验、故障分析和混合模式仿真，研究了电磁脉冲 (EMP) 引起的 L 波段砷化镓基低噪声放大器 (LNA) 的非线性退化。实验结果表明，低噪声放大器样品在电磁脉冲作用下的实时响应、射频和直流特性表现出非线性和永久性退化特征。具体来说，随着注入功率的增加，特性首先下降，然后略微恢复。此外，非线性退化与脉冲特性密切相关。故障分析表明，LNA 的退化归因于第一级高电子迁移率晶体管栅极金属条下方和周围的潜在故障缺陷，EMP 诱导的“退火效应”很好地解释了恢复。仿真结果表明，如果脉冲重复频率小于2.5 kHz，则不会发生脉冲重复引起的热积累效应，脉冲宽度τ主要决定了实际作用持续时间和“退火效应”的温度。基于上述机制，很好地解释了脉冲特性对非线性退化的依赖性。