Residual stresses play a crucial role in both light-electricity conversion performances and the lifespan of photovoltaic (PV) cells. In this paper, the residual stress of triple junction cells (i.e. GaInP/GaInAs/Ge) induced by laser-driven massive micro-particle impact is analyzed with a novel method based on backscattering Raman spectroscopy. The impact process, which induces damage to the PV cells and brings the residual stress, is also investigated by optical microscopy (OM) and Scanning Electron Microscopy (SEM). The results show that the PV cells would exhibit various damage patterns. At the same time, strong residual stresses up to hundreds of MPa introduced in the damaged PV cells after impact have been analysis, providing an effective perspective to better understand the damage behavior and residual stress features of PV cells during their service life.

中文翻译：

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薄膜光伏电池在大质量微粒冲击下的残余应力分析

残余应力在光电转换性能和光伏 (PV) 电池的寿命中都起着至关重要的作用。在本文中，三结电池的残余应力（即采用基于背散射拉曼光谱的新方法分析激光驱动的大质量微粒撞击引起的 GaInP/GaInAs/Ge)。还通过光学显微镜 (OM) 和扫描电子显微镜 (SEM) 研究了对 PV 电池造成损坏并带来残余应力的冲击过程。结果表明，光伏电池会表现出各种损坏模式。同时，对受损光伏电池在冲击后引入的高达数百 MPa 的强残余应力进行了分析，为更好地了解光伏电池在其使用寿命期间的损伤行为和残余应力特征提供了有效的视角。