当前位置: X-MOL 学术Microchem. J. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Infrared spectroscopic mapping imaging for depth analysis of artworks
Microchemical Journal ( IF 4.8 ) Pub Date : 2020-07-01 , DOI: 10.1016/j.microc.2020.104869
Stamatios Amanatiadis , Eirini-Chrysanthi Tsardaka , Theodosios Karamanos , Georgios Karagiannis

Abstract In this work, infrared spectroscopy, supported by acoustic microscopy, is utilized for the analysis of artworks regarding the sub-surface details. It is well-known that electromagnetic energy is able to penetrate into deeper than the surface layers as the wavelength is increased. For this reason, the infrared spectral band is capable of revealing sub-surface details in artworks, especially at the mid and far infrared regions. There, the IR fingerprint of several materials exists and classification methods can be implemented to separate them. Consequently, the extracted information depends on the observed wavelength of the infrared spectrum and different images can be evaluated from various layers of the artwork. To this aim, we apply the Fourier transform infrared spectroscopic mapping imaging method to acquire hyperspectral cube images at the region from 400 cm − 1 to 7000 cm − 1 . Then, the images at different layers are extracted via the integration at the desired wavelengths, while the appropriate selection of spectral bands is, also, assisted through acoustic microscopy.

中文翻译:

用于艺术品深度分析的红外光谱映射成像

摘要 在这项工作中,红外光谱在声学显微镜的支持下被用于艺术品的亚表面细节分析。众所周知,随着波长的增加,电磁能能够渗透到比表层更深的地方。因此,红外光谱带能够揭示艺术品的次表面细节,尤其是在中远红外区域。在那里,存在几种材料的红外指纹,并且可以实施分类方法来将它们分开。因此,提取的信息取决于观察到的红外光谱波长,并且可以从艺术品的各个层评估不同的图像。为了这个目标,我们应用傅里叶变换红外光谱映射成像方法在400 cm - 1 到7000 cm - 1 区域获取高光谱立方体图像。然后,通过在所需波长的积分下通过集成提取不同层的图像,而相应的光谱带也是通过声学显微镜辅助的。
更新日期:2020-07-01
down
wechat
bug