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Influence of sodium peroxide during the synthesis of SiO2 obtained from rice husk
Materials Science in Semiconductor Processing ( IF 4.1 ) Pub Date : 2020-08-01 , DOI: 10.1016/j.mssp.2020.105087
J. Sastré-Hernández , J.R. Aguilar-Hernández , J. Santoyo-Salazar , H.M. Alfaro , J.E. Hoyos-García , M. Tufiño-Velázquez , G. Contreras-Puente

Abstract In this work silicon dioxide (SiO2) was synthesized from rice husk as raw material. The sodium peroxide (Na2O2) influence as precursor on the catalytic activity of the final product was investigated. α-cristobalite and tridymite phases of SiO2 were matched by X-Ray Diffraction (XRD) and analyzed by Fourier Transform Infrared (FTIR), Raman Spectroscopy (RS), Scanning Electron Microscopy (SEM) and Energy Dispersive Spectroscopy (EDS). The XRD Rietveld Refinement showed few changes as function of sodium peroxide added during the processing. The content of tridymite phase determined in the samples, was diminished from 19.3% to 8.5%. The main α-cristobalite SiO2 phase was identified from XRD, FTIR and RS spectra, while EDS results showed characteristic energy peaks due to the presence of oxygen and silicon, as expected. Particles and cavities in micrometric range were observed at the samples by SEM. However, smooth surfaces were well defined in other samples. The final morphology depending on the amount of sodium peroxide added. The SiO2 produced powder is suitable for the processing of silicon, silicon oxide as well as silicon nitrides thin films.

中文翻译:

过氧化钠对稻壳SiO2合成过程的影响

摘要 本研究以稻壳为原料合成了二氧化硅(SiO2)。研究了作为前体的过氧化钠 (Na2O2) 对最终产物催化活性的影响。SiO2 的 α-方石英和鳞石英相通过 X 射线衍射 (XRD) 进行匹配,并通过傅里叶变换红外 (FTIR)、拉曼光谱 (RS)、扫描电子显微镜 (SEM) 和能量色散光谱 (EDS) 进行分析。XRD Rietveld 细化显示出在加工过程中添加的过氧化钠的函数几乎没有变化。样品中测定的鳞石英相的含量从 19.3% 减少到 8.5%。从 XRD、FTIR 和 RS 光谱确定了主要的 α-方石英 SiO2 相,而 EDS 结果显示出由于氧和硅的存在而产生的特征能量峰,正如预期的那样。通过SEM在样品上观察到微米范围内的颗粒和空腔。然而,光滑表面在其他样品中得到了很好的定义。最终形态取决于加入的过氧化钠的量。生产的 SiO2 粉末适用于加工硅、氧化硅和氮化硅薄膜。
更新日期:2020-08-01
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