In microscopy, proper modeling of the image formation has a substantial effect on the precision and accuracy in localization experiments and facilitates the correction of aberrations in adaptive optics experiments. The observed images are subject to polarization effects, refractive index variations, and system specific constraints. Previously reported techniques have addressed these challenges by using complicated calibration samples, computationally heavy numerical algorithms, and various mathematical simplifications. In this work, we present a phase retrieval approach based on an analytical derivation of the vectorial diffraction model. Our method produces an accurate estimate of the system’s phase information, without any prior knowledge about the aberrations, in under a minute.

中文翻译：

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VIPR：相位检索的矢量实现，用于快速准确的微观像素级瞳孔估计

在显微镜中，图像形成的适当建模对定位实验的精度和准确度有重大影响，并有助于自适应光学实验中的像差校正。观察到的图像受偏振效应、折射率变化和系统特定约束的影响。先前报道的技术通过使用复杂的校准样本、计算量大的数值算法和各种数学简化来解决这些挑战。在这项工作中，我们提出了一种基于矢量衍射模型解析推导的相位检索方法。我们的方法在一分钟内生成系统相位信息的准确估计，而无需任何关于像差的先验知识。