In this article, the impact of the combination of the column-level gain and the correlated multiple sampling (CMS) on the noise of CMOS image sensor (CIS) readout chains is first analyzed. The theory is then validated experimentally with CIS readout chains embedding two different pixels, a variable gain column-level amplifier (CLA) and a passive switched-capacitor (SC) CMS circuit. The noise measurements include photon transfer curves (PTCs) for different gains and pixels and they show reasonably well that CMS reduces the 1/f noise by about 33% for order 8 as expected theoretically.

中文翻译：

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模拟CMS对CIS读出噪声影响的实验验证

在本文中，首先分析了列级增益和相关多重采样 (CMS) 的组合对 CMOS 图像传感器 (CIS) 读出链噪声的影响。然后通过嵌入两个不同像素、可变增益列级放大器 (CLA) 和无源开关电容器 (SC) CMS 电路的 CIS 读出链对该理论进行实验验证。噪声测量包括不同增益和像素的光子转移曲线 (PTC)，它们相当好地表明 CMS 将 8 阶的 1/f 噪声降低了约 33%，正如理论上预期的那样。