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The Last Byte: Big Data, Big Faults
IEEE Design & Test ( IF 2 ) Pub Date : 2020-02-06 , DOI: 10.1109/mdat.2019.2957362
Scott Davidson

One of the keynote addresses at the just concluded International Test Conference noted that even very high fault coverage (over 99%) in billion transistor circuits will still leave hundreds of thousands of untested faults. The speaker was concerned about the quality issues due to this, and also security issues. If all these untested faults represent a block of untested logic, how can we be sure that the untested logic wasn’t inserted by some third party?

中文翻译:

最后字节:大数据,大故障

主题演讲之一在刚刚结束的国际测试会议上的演讲指出,即使十亿个晶体管电路中的故障覆盖率非常高(超过99%),仍然会留下数十万个未经测试的故障。发言人担心由此引起的质量问题以及安全问题。如果所有这些未经测试的故障都代表未经测试的逻辑块,那么我们如何确定未经测试的逻辑不是由某些第三方插入的呢?
更新日期:2020-04-21
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