Abstract—

The methodology and results of absolute dee voltage measurements using the X-ray spectrum method at the FLNR JINR cyclotrons are presented. An Amptek XR-100T-CdTe semiconductor detector was used to measure bremsstrahlung spectra. The technique was tested on the U-400M isochronous cyclotron and was used to adjust the high-frequency accelerating system to the operating mode during commissioning of the DC-280 cyclotron.

中文翻译：

---

X射线光谱法测量FLNR JINR回旋加速器上绝对Dee电压的方法和结果

摘要-

给出了在FLNR JINR回旋加速器上使用X射线光谱法测量绝对Dee电压的方法和结果。使用Amptek XR-100T-CdTe半导体检测器测量致辐射光谱。该技术在U-400M同步回旋加速器上进行了测试，并用于在DC-280回旋加速器调试期间将高频加速系统调整为工作模式。