Abstract

A report on the manipulation of structural, optical, and electrical properties of nanocrystalline CdS (ncCdS) thin films in the framework of varying Ar ambient pressure in pulsed laser deposition (PLD) is presented here. Increase in Ar ambient pressure results in reduction of crystallite size which in turns increases the structural imperfections and structural phase transformation of ncCdS thin films. The most significant observation here is the bleaching of multiphonon Raman modes (MRMs) particularly LO + 2E₂, 2LO + 2E₂, etc. in ncCdS thin films. An acute investigation on the reason of bleaching of LO + 2E₂, 2LO + 2E₂, etc. modes is carried out here and concluded that it is due to the fading of E₂ mode with increasing Ar pressure as confirmed by low-frequency micro-Raman measurements. UV–visible absorption and photoluminescence spectroscopies are used to examine the optical properties like bandgap and possible electronic transitions in ncCdS thin films. Further, transport properties of ncCdS thin films are investigated using Hall measurement and I–V characteristics.

中文翻译：

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Ar环境压力在纳米CdS薄膜控制性能中的重要作用

摘要

本文介绍了在脉冲激光沉积（PLD）中，在不断变化的Ar环境压力下，纳米CdS（ncCdS）纳米薄膜的结构，光学和电学性能操纵的报告。Ar环境压力的增加导致微晶尺寸的减小，这反过来又增加了ncCdS薄膜的结构缺陷和结构相变。这里最显著观察是多声子拉曼模式（MRMS）特别LO + 2E的漂白₂，2LO + 2E ₂等在ncCdS薄膜。在LO + 2E的漂白的原因急性调查₂，2LO + 2E ₂等模式在这里进行，并得出结论认为，这是由于E的衰落₂低频微拉曼测量证实，Ar压力增加。紫外可见吸收和光致发光光谱学用于检查光学性能，例如带隙和ncCdS薄膜中可能的电子跃迁。此外，ncCdS薄膜的传输属性是使用霍尔测量和研究我- V特性。