Abstract Secondary electron energy dependent ionization cross-sections for the C2H2 and C2H5OH molecules by electron-collision have been calculated at a set of impinging electron energies 100 and 200 eV. The revisited Jain-Khare semiempirical approach based on the Born approximation has been employed to calculate these cross-sections. The averaged secondary electron energy and the integral total ionization cross-sections are evaluated from the energy dependent ionization cross-sections in energy range ionization threshold to 2000 eV. The calculated total ionization cross-sections are extended up to 6000 eV using Born-Bethe analysis. A comparison of the presently evaluated total ionization cross-sections with the available various theoretical and the experimental results revealed a satisfactory agreement.

中文翻译：

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C2H2 和 C2H5OH 的电子碰撞电离截面

摘要 在一组 100 和 200 eV 的碰撞电子能量下，计算了 C2H2 和 C2H5OH 分子通过电子碰撞产生的二次电子能量依赖电离截面。基于 Born 近似的重新审视的 Jain-Khare 半经验方法已被用于计算这些横截面。平均二次电子能量和积分总电离横截面是从能量范围电离阈值到 2000 eV 中的能量相关电离横截面评估的。使用 Born-Bethe 分析，计算出的总电离截面可扩展至 6000 eV。目前评估的总电离截面与可用的各种理论和实验结果的比较显示出令人满意的一致性。