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Impact of Ge deposition temperature on parameters of c-Si solar cells with surface texture formed by etching of Si using SiGe islands as a mask
Materials Science in Semiconductor Processing ( IF 4.1 ) Pub Date : 2020-08-01 , DOI: 10.1016/j.mssp.2020.105065
V.H. Nguyen , A. Novikov , M. Shaleev , D. Yurasov , M. Semma , K. Gotoh , Y. Kurokawa , N. Usami

Abstract In this paper, the Ge self-assembled islands grown at different temperatures were used as an etching mask for selective anisotropic etching of crystalline silicon (c-Si) in order to form a textured Si surface. The effects of Ge deposition temperature on the texture morphology as well as the parameters of c-Si solar cells fabricated on such structures were studied with the range of temperature from 500 °C to 800 °C. The textures on Si surface with low (

中文翻译:

Ge沉积温度对具有表面纹理的c-Si太阳能电池参数的影响,使用SiGe岛作为掩模蚀刻Si

摘要 本文将在不同温度下生长的Ge自组装岛用作蚀刻掩模,对晶体硅(c-Si)进行选择性各向异性蚀刻,以形成纹理化的Si表面。在500°C至800°C的温度范围内研究了Ge沉积温度对在这种结构上制造的c-Si太阳能电池的织构形貌和参数的影响。Si 表面的织构具有低 (
更新日期:2020-08-01
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