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Synergistic effects of high energy helium irradiation and damage introduction at high temperature on hydrogen isotope retention in plasma facing materials
Journal of Nuclear Materials ( IF 3.1 ) Pub Date : 2020-03-18 , DOI: 10.1016/j.jnucmat.2020.152122
F. Sun , M. Nakata , S.E. Lee , M. Zhao , T. Wada , S. Yamazaki , A. Koike , S. Kondo , T. Hinoki , M. Hara , Y. Oya

In this study, energetic helium (He) ion irradiation was performed to obtain bulk He distribution in tungsten (W) materials, concurrent with damage introduction at high temperature. Then, deuterium (D) implantation and thermal desorption spectrometry were performed to evaluate D retention. At the same time, the surface tritium (T) concentration and depth distribution were evaluated by imaging plate (IP) and β-ray induced X-ray spectroscopy (BIXS) measurements after mixed D-T gas exposure. Numerical simulations were applied to evaluate changes in binding energies, diffusion depths, and trapping sites under different irradiation conditions. The results showed that weak trapping sites with higher concentration, such as vacancies, were produced during only energetic He+ irradiation events, leading to enhancement of D retention. Fe3+-He+ simultaneous irradiation promoted the formation of HexVy complexes, which reduced the concentration of vacancy trapping sites and changed the stress field around defects, leading to the suppression of D trapping behavior. From the reduced effects of D retention caused by HexVy complexes at higher temperatures, the results suggested that defect recovery was the dominant mechanism. With increasing damage level at higher temperatures, more weak trapping sites, such as dislocations and vacancies sites, were produced, leading to a more dominant influence on D retention than HexVy complex effects. It was also found that HexVy complexes prevented D diffusion to the bulk and that simulation results showed that the damage level had little impact on D diffusion depth.



中文翻译:

高能氦气辐射和高温下的损伤引入对等离子体材料中氢同位素保留的协同效应

在这项研究中,进行了高能氦(He)离子辐照,以在钨(W)材料中获得大量He分布,同时在高温下引入了损伤。然后,进行氘(D)注入和热解吸光谱分析以评估D保留。同时,在混合DT气体暴露后,通过成像板(IP)和β射线诱导X射线光谱(BIXS)测量来评估表面tri(T)的浓度和深度分布。应用数值模拟来评估在不同照射条件下结合能,扩散深度和俘获位点的变化。结果表明,仅在高能的He +期间,才会产生高浓度的弱陷阱位点,例如空位。辐射事件,导致D保留增强。Fe 3+ -He +同时照射促进了He x V y络合物的形成,从而降低了空位俘获位点的浓度并改变了缺陷周围的应力场,从而抑制了D俘获行为。从在较高温度下由He x V y配合物引起的D保留减少的影响来看,结果表明缺陷恢复是主要机制。随着高温下损伤程度的增加,产生了更弱的俘获位点,例如位错和空位位点,从而导致对D保留的影响比He x V y更重要。复杂的影响。还发现He x V y配合物阻止了D扩散到整个主体,并且模拟结果表明,损伤程度对D扩散深度的影响很小。

更新日期:2020-03-19
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