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New Insights on Output Capacitance Losses in Wide-Band-Gap Transistors
IEEE Transactions on Power Electronics ( IF 6.7 ) Pub Date : 2020-07-01 , DOI: 10.1109/tpel.2019.2958000
Mohammad Samizadeh Nikoo , Armin Jafari , Nirmana Perera , Elison Matioli

The low on-resistance of wide-band-gap (WBG) transistors is a key feature for efficient power converters; however, the anomalous loss in their output capacitance (COSS) severely limits their performance at high switching frequencies. Characterizing COSS losses based on the large-signal measurement methods requires an extensive effort, as separate measurements are needed at different operation points, including voltage swing, frequency, and dv/dt. Furthermore, there is a practical tradeoff in the maximum voltage and frequency applied to the device. Here, we introduce a new circuit model, including an effective COSS and a frequency-dependent series resistance, along with a simple small-signal method to fully characterize COSS losses in WBG transistors. The method accurately predicts COSS losses at any voltage swing or frequency. Contrary to other methods, this technique directly leads to a general identification of COSS losses at different operation points, revealing new insights on COSS losses in WBG transistors, especially the dependence of EDISS on voltage and frequency. Based on the proposed approach, the issue of COSS losses in enhancement-mode GaN and SiC transistors was assigned to the limited quality factor of COSS. The precise characterization of COSS losses proposed in this letter is essential for designing efficient high-frequency power converters.

中文翻译:

关于宽带隙晶体管输出电容损耗的新见解

- 宽带隙 (WBG) 晶体管的电阻是高效电源转换器的关键特性;然而,其输出电容的异常损耗(COSS ) 严重限制了它们在高开关频率下的性能。表征C基于大信号测量方法的OSS损耗需要大量的工作,因为需要在不同的工作点进行单独的测量,包括电压摆幅、频率和影音/dt. 此外,在应用于设备的最大电压和频率方面存在实际权衡。在这里,我们介绍了一个新的电路模型,包括一个有效的COSS和一个频率相关的串联电阻,以及一个简单的小信号方法来充分表征CWBG 晶体管中的OSS损耗。该方法准确预测C任何电压摆幅或频率下的OSS损耗。与其他方法相反,这种技术直接导致对COSS在不同操作点的损失,揭示了新的见解CWBG 晶体管中的OSS损耗,尤其是对电压和频率上的DISS。基于所提出的方法,问题C增强型 GaN 和 SiC 晶体管中的OSS损耗归因于有限的品质因数C开源软件。的精确表征C这封信中提出的OSS损耗对于设计高效的高频电源转换器至关重要。
更新日期:2020-07-01
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