Refraction sensitivity can be optimised for differential x-ray phase contrast (XPC) imaging methods by modifying the set-up. Often, modifications involve changing source/detector parameters, propagation distances, or the design of optical components, i.e. parameters that are not readily changed without non-trivial time investment, replacing components, or performing high-precision recalibrations. The edge illumination (EI) XPC method provides a method of optimising the refraction sensitivity, by exploiting micrometric translations of its periodic masks, that bypasses the constraints listed above. These translations can be performed on-the-fly and allow optimising the refraction signal for specific applications without making significant changes to the set-up. The method can prove advantageous for lab-based systems that make use of larger sources but with limited available set-up space. In this paper, we study how refraction sensitivity varies as a function of illuminated pixel f...

中文翻译：

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针对基于实验室的边缘照明相位对比设置优化折射灵敏度的实验方法

通过修改设置，可以针对差分X射线相衬（XPC）成像方法优化折射灵敏度。通常，修改涉及更改源/检测器参数，传播距离或光学组件的设计，即在不花费大量时间的情况下不容易更改，更换组件或执行高精度重新校准的参数。边缘照明（EI）XPC方法提供了一种通过利用其周期性掩模的微米级平移来优化折射灵敏度的方法，该方法绕过了上面列出的约束。这些转换可以即时执行，并允许针对特定应用优化折射信号，而无需对设置进行重大更改。对于使用较大源但可用设置空间有限的基于实验室的系统，该方法可以证明是有利的。在本文中，我们研究了折射灵敏度如何随照明像素f的变化而变化。