In the present work the drawbacks of chitosan:AgNO₃(CS:AgNt) mediated by TiO₂ filler for polymer electrolyte fabrication and membrane separation technology were discussed. The phenomena of reduction of silver ions to metallic silver particles were explained based on various techniques such as UV–vis, XRD, SEM, EDX, OM and TEM. An increase in intensity and broadness of surface plasmon resonance (SPR) peak in the UV–vis absorption spectra revealed the formation of a high amount of silver nanoparticles (Ag NPs). The high dielectric constant of TiO₂ filler was responsible for the reduction of more silver ions. The crystalline peaks in XRD pattern confirmed the formation of metallic silver particles. The OM images showed Ag NPs with bulk sizes. The SEM images and EDX spectra confirmed the existence of Ag NPs. The TEM images illustrated silver particles with small sizes in CS:AgNt system. To investigate the stability of silver ions, the electrical properties were performed. The increase of resistance and decrease in dielectric constant at high TiO₂ concentration confirmed the deficiency of the prepared films for electrochemical device application. Distinct peaks appeared in the imaginary (M_i) component of electric modulus spectra and no peaks were seen in dielectric loss spectra.

在本工作中，讨论了由TiO ₂填料介导的壳聚糖：AgNO ₃（CS：AgNt）在聚合物电解质制备和膜分离技术中的缺点。根据各种技术，例如紫外可见，XRD，SEM，EDX，OM和TEM，解释了将银离子还原为金属银颗粒的现象。UV-vis吸收光谱中表面等离振子共振（SPR）峰的强度和宽度的增加表明大量银纳米颗粒（Ag NPs）的形成。TiO ₂的高介电常数填料负责还原更多的银离子。XRD图谱中的结晶峰证实了金属银颗粒的形成。OM图像显示Ag NP具有大尺寸。SEM图像和EDX光谱证实了Ag NP的存在。TEM图像显示CS：AgNt系统中的银颗粒尺寸较小。为了研究银离子的稳定性，进行了电性能。在高TiO ₂浓度下，电阻的增加和介电常数的降低证实了所制备的用于电化学装置的薄膜的不足。在电模量谱的虚部（M _i）中出现明显的峰，而在介电损耗谱中未见峰。