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A Wide-Range Variation-Resilient Physically Unclonable Function in 28 nm
IEEE Journal of Solid-State Circuits ( IF 5.4 ) Pub Date : 2020-03-01 , DOI: 10.1109/jssc.2019.2942374
Zhen-Yu Liang , Hao-Hsuan Wei , Tsung-Te Liu

This article presents a wide-range, variation-resilient physically unclonable function (PUF) to provide a reliable security primitive solution. The proposed ring oscillator-based PUF employs several stabilization techniques to maintain robustness under environmental variations. The proposed PUF design uses a delay cell topology with an adjusted signal slope to amplify the impact of device variability on delay mismatch. Moreover, an online calibration system that extracts in situ PUF delay information and re-configures stage interconnects is employed to further enlarge frequency mismatch and improve stability. Measurement results from a prototype fabricated in a 28-nm CMOS technology show that the proposed PUF design achieves a highly stable performance over a wide range of operating conditions, with a worst case bit error rate (BER) of 0.55% across 0.4–1.3 V and −40 to 125 °C. The measured BER sensitivities to supply voltage (0.0546%/0.1 V) and temperature (0.0052%/10 °C) demonstrate the stability improvements of 2.38 and 28.84 times, respectively, when compared with the state-of-the-art results.

中文翻译:

28 nm 波长范围内的物理不可克隆函数

本文介绍了一种范围广泛、具有变化弹性的物理不可克隆函数 (PUF),以提供可靠的安全原语解决方案。所提出的基于环形振荡器的 PUF 采用多种稳定技术来保持环境变化下的鲁棒性。建议的 PUF 设计使用具有调整信号斜率的延迟单元拓扑来放大器件可变性对延迟失配的影响。此外,采用在线校准系统提取原位 PUF 延迟信息并重新配置级互连,以进一步扩大频率失配并提高稳定性。使用 28 纳米 CMOS 技术制造的原型的测量结果表明,所提出的 PUF 设计在广泛的工作条件下实现了高度稳定的性能,最坏情况下的误码率 (BER) 为 0。在 0.4–1.3 V 和 −40 到 125 °C 范围内为 55%。与最先进的结果相比,测得的 BER 对电源电压 (0.0546%/0.1 V) 和温度 (0.0052%/10 °C) 的灵敏度分别提高了 2.38 和 28.84 倍的稳定性。
更新日期:2020-03-01
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