Ferroelectric materials, and more specifically ferroelectric domain walls (DWs) have become an area of intense research in recent years. Novel physical phenomena have been discovered at these nanoscale topological polarisation discontinuities by mapping out the polarisation in each atomic unit cell around the DW in a scanning transmission electron microscope (STEM). However identifying these features requires an understanding of the polarisation in the overall domain structure of the TEM sample, which is often a time consuming process. Here a fast method of polarisation mapping in the TEM is presented, which can be applied to a range of ferroelectric materials. Due to the coupling of polarisation to spontaneous strain we can isolate different strain states and demonstrate the fast mapping of the domain structure in ferroelectric lead titanate (PTO). The method only requires a high resolution (HR) TEM or STEM image and is less sensitive to zone axis or local strain effects which may affect other techniques. Thus it is easily applicable to in-situ experiments. The complimentary benefits of Fourier masking with more advanced mapping strategies and its application to other materials are discussed. These results imply that Fourier masked polarisation mapping will be a useful tool for electron microscopists in streamlining their analysis of ferroelectric TEM samples. This article is protected by copyright. All rights reserved.

中文翻译：

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使用傅立叶掩蔽的铁电体中的快速极化映射

铁电材料，更具体地说是铁电畴壁 (DW)，近年来已成为一个热门研究领域。通过在扫描透射电子显微镜 (STEM) 中绘制 DW 周围每个原子晶胞中的极化，在这些纳米级拓扑极化不连续处发现了新的物理现象。然而，识别这些特征需要了解 TEM 样品整个域结构中的极化，这通常是一个耗时的过程。这里介绍了一种快速的 TEM 偏振映射方法，该方法可应用于一系列铁电材料。由于极化与自发应变的耦合，我们可以隔离不同的应变状态并演示铁电钛酸铅 (PTO) 域结构的快速映射。该方法只需要高分辨率 (HR) TEM 或 STEM 图像，并且对可能影响其他技术的区域轴或局部应变效应不太敏感。因此它很容易适用于原位实验。讨论了傅立叶掩蔽与更高级映射策略的互补优势及其在其他材料中的应用。这些结果意味着傅里叶屏蔽偏振映射将成为电子显微镜工作者简化铁电 TEM 样品分析的有用工具。本文受版权保护。版权所有。该方法只需要高分辨率 (HR) TEM 或 STEM 图像，并且对可能影响其他技术的区域轴或局部应变效应不太敏感。因此它很容易适用于原位实验。讨论了傅立叶掩蔽与更高级映射策略的互补优势及其在其他材料中的应用。这些结果意味着傅里叶屏蔽偏振映射将成为电子显微镜工作者简化铁电 TEM 样品分析的有用工具。本文受版权保护。版权所有。该方法只需要高分辨率 (HR) TEM 或 STEM 图像，并且对可能影响其他技术的区域轴或局部应变效应不太敏感。因此它很容易适用于原位实验。讨论了傅立叶掩蔽与更高级映射策略的互补优势及其在其他材料中的应用。这些结果意味着傅里叶屏蔽偏振映射将成为电子显微镜工作者简化铁电 TEM 样品分析的有用工具。本文受版权保护。版权所有。这些结果意味着傅里叶屏蔽偏振映射将成为电子显微镜工作者简化铁电 TEM 样品分析的有用工具。本文受版权保护。版权所有。这些结果意味着傅里叶屏蔽偏振映射将成为电子显微镜工作者简化铁电 TEM 样品分析的有用工具。本文受版权保护。版权所有。