In this study, size-selected platinum (Pt) nanoclusters were imaged with aberration-corrected scanning transmission electron microscopy (STEM) in high angle annual dark field (HAADF) mode. For image analysis, a relatively simple macro program was developed by making use of existing ImageJ plug-ins. The macro allows effectively for assessing criterions chosen for intensity threshold and filter blurring factors. It can extract the integrated HAADF intensity, peak intensity, and projected area of the clusters. Here, the effects of magnification and objective lens defocus on nanocluster measurement were investigated. It was found that the integrated HAADF intensity of Pt clusters is a more robust sample descriptor than the peak intensity and the projected area. The macro program developed is freely available. This article is protected by copyright. All rights reserved.

中文翻译：

---

尺寸选择的铂纳米团簇的 HAADF-STEM 图像分析

在这项研究中，在高角度年度暗场 (HAADF) 模式下，使用像差校正的扫描透射电子显微镜 (STEM) 对尺寸选择的铂 (Pt) 纳米团簇进行成像。对于图像分析，利用现有的 ImageJ 插件开发了一个相对简单的宏程序。宏允许有效地评估为强度阈值和过滤器模糊因素选择的标准。它可以提取聚类的积分 HAADF 强度、峰值强度和投影面积。在这里，研究了放大倍数和物镜散焦对纳米团簇测量的影响。发现 Pt 簇的积分 HAADF 强度是比峰值强度和投影面积更可靠的样本描述符。开发的宏程序是免费提供的。本文受版权保护。