PSICHE is a high-energy, multi-technique beamline at the SOLEIL synchrotron facility. It performs X-ray tomography for materials science and other applications and X-ray diffraction for samples at extreme conditions. The beamline has been in service for user experiments since 2013, but is in continual development to add new capabilities. In this article, we present a series of new developments which combine diffraction and tomography and which are of relevance to the study of materials and manufacturing. By combining these techniques, we can add quantitative structural information from diffraction to morphological information obtained by tomography. Recent developments in very fast tomography allow dynamic processes to be studied in situ and in 3D with a time (frequency) resolution of 2 Hz. We have developed in situ sample environments to enable fast tomography measurements at high temperature and pressure, which will allow future studies of industrial processes such as hot isostatic pressing (HIP).

中文翻译：

---

PSICHE Beamline上的断层成像最新进展

PSICHE是SOLEIL同步加速器设施中的高能量，多技术束线。它在材料科学和其他应用中执行X射线断层扫描，在极端条件下对样品进行X射线衍射。Beamline自2013年以来一直在为用户实验服务，但仍在不断开发中以增加新功能。在本文中，我们提出了一系列结合衍射和层析成像技术的新进展，这些新进展与材料和制造的研究相关。通过结合这些技术，我们可以将来自衍射的定量结构信息添加到通过层析成像获得的形态学信息中。快速断层扫描技术的最新发展允许以2 Hz的时间（频率）分辨率对原位和3D动态过程进行研究。