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Leakage conduction behavior for top- and bottom-contact pentacene thin film transistors
Indian Journal of Physics ( IF 2 ) Pub Date : 2019-06-24 , DOI: 10.1007/s12648-019-01526-3
Yow-Jon Lin , Chang-Lin Wu , Chia-Hung Chiang , Po-Chih Kuo

The leakage conduction mechanisms for top-contact and bottom-contact pentacene-based organic thin film transistors (OTFTs) are studied. OTFTs that use a bottom-contact design exhibit lower leakage conduction than those that use a top-contact design. For top-contact OTFTs, the dominant leakage conduction mechanism is via Schottky emission and the density of the leakage current increases significantly as the bias voltage increases. For bottom-contact OTFTs, the dominant leakage conduction mechanism is via displacement current. OTFTs that use a bottom-contact design exhibit lower leakage conduction than those that use a top-contact design.

中文翻译:

上下接触并五苯薄膜晶体管的漏电传导行为

研究了顶部接触和底部接触并五苯有机薄膜晶体管(OTFT)的泄漏传导机理。与使用顶部接触设计的OTFT相比,使用底部接触设计的OTFT的泄漏传导更低。对于顶部接触式OTFT,主要的泄漏传导机制是通过肖特基发射,并且随着偏置电压的增加,泄漏电流的密度显着增加。对于底部接触式OTFT,主要的泄漏传导机制是通过位移电流。与使用顶部接触设计的OTFT相比,使用底部接触设计的OTFT的泄漏传导更低。
更新日期:2019-06-24
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