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Automated analysis of evolving interfaces during in situ electron microscopy
Advanced Structural and Chemical Imaging Pub Date : 2016-02-26 , DOI: 10.1186/s40679-016-0016-z
Nicholas M. Schneider , Jeung Hun Park , Michael M. Norton , Frances M. Ross , Haim H. Bau

In situ electron microscopy allows one to monitor dynamical processes at high spatial and temporal resolution. This produces large quantities of data, and hence automated image processing algorithms are needed to extract useful quantitative measures of the observed phenomena. In this work, we outline an image processing workflow for the analysis of evolving interfaces imaged during liquid cell electron microscopy. As examples, we show metal electrodeposition at electrode surfaces; beam-induced nanocrystal formation and dissolution; and beam-induced bubble nucleation, growth, and migration. These experiments are used to demonstrate a fully automated workflow for the extraction of, among other things, interface position, roughness, lateral wavelength, local normal velocity, and the projected area of the evolving phase as functions of time. The relevant algorithms have been implemented in Mathematica and are available online.

中文翻译:

在原位电子显微镜过程中自动分析不断演变的界面

原位电子显微镜允许人们以高时空分辨率监测动态过程。这会产生大量数据,因此需要自动图像处理算法来提取观察到的现象的有用定量度量。在这项工作中,我们概述了图像处理工作流程,用于分析液体细胞电子显微镜成像过程中不断演变的界面。作为示例,我们显示了电极表面的金属电沉积。束流诱导的纳米晶体的形成和溶解;以及束流引起的气泡成核,生长和迁移。这些实验用于演示一种全自动的工作流程,用于提取界面位置,粗糙度,横向波长,局部法向速度和演化相的投影面积随时间的变化等。
更新日期:2016-02-26
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