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The effect of microstructure parameters on the residual stresses in the ultrafine-grained sheets.
Micron ( IF 2.4 ) Pub Date : 2020-02-03 , DOI: 10.1016/j.micron.2020.102843
Farshad Nazari 1 , Mohammad Honarpisheh 2 , Haiyan Zhao 3
Affiliation  

In this research, the influence of microstructure parameters on the residual stresses of ultrafine-grained sheets was investigated. For this purpose, the constrained groove pressing (CGP) process was carried out on the copper sheets with 3 mm thickness, and residual stresses of the CGPed sheets was measured using the contour method. Microstructure of the CGPed specimens was evaluated by the optical microscopy, micro x-ray diffraction (micro-XRD), and transmission electron microscopy (TEM) experiments. Microstructure parameters including crystallites size, dislocations density, and lattice strain were calculated using Williamson-Hall and Williamson-Smallman equations, and the calculated results were validated by the TEM images. The influence of these parameters on the residual stresses was investigated by analysis of variance (ANOVA) method, and two approaches were considered in this way. According to the results, the CGP process can create nanostructures in the CGPed sheets, and with increasing number of CGP passes, grains size, crystallites size, lattice strain, and residual stresses decrease, and density of dislocations increases. Microstructure parameters have a significant effect on the macro-residual stresses, and strain is the most effective parameter. Also, in the ultrafine-grained sheets, micro-parameters have an undeniable contribution, which is the same as that of macro-parameters on the macro-residual stresses.



中文翻译:

微观结构参数对超细晶粒板中残余应力的影响。

在这项研究中,研究了微观结构参数对超细晶粒板残余应力的影响。为此,在厚度为3 mm的铜板上进行了约束槽压制(CGP)工艺,并使用轮廓法测量了CGP板的残余应力。通过光学显微镜,显微X射线衍射(micro-XRD)和透射电子显微镜(TEM)实验评估了CGPed标本的微观结构。利用Williamson-Hall和Williamson-Smallman方程计算了微结构参数,包括微晶尺寸,位错密度和晶格应变,并通过TEM图像验证了计算结果。通过方差分析(ANOVA)方法研究了这些参数对残余应力的影响,并且以这种方式考虑了两种方法。根据结果​​,CGP工艺可以在CGP板材中形成纳米结构,并且随着CGP道次的增加,晶粒尺寸,微晶尺寸,晶格应变和残余应力降低,位错密度增加。微观结构参数对宏观残余应力有很大影响,而应变是最有效的参数。另外,在超细颗粒板中,微观参数具有不可否认的作用,这与宏观参数对宏观残余应力的贡献相同。位错的密度增加。微观结构参数对宏观残余应力有很大影响,而应变是最有效的参数。另外,在超细颗粒板中,微观参数具有不可否认的作用,这与宏观参数对宏观残余应力的贡献相同。位错的密度增加。微观结构参数对宏观残余应力有很大影响,而应变是最有效的参数。另外,在超细颗粒板中,微观参数具有不可否认的作用,这与宏观参数对宏观残余应力的贡献相同。

更新日期:2020-02-03
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