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Temperature-dependence calculation of lattice thermal conductivity and related parameters for the zinc blende and wurtzite structures of InAs nanowires
Bulletin of Materials Science ( IF 1.8 ) Pub Date : 2020-01-24 , DOI: 10.1007/s12034-019-2011-1
Hawbash H Karim , M S Omar

Theoretical calculations are performed on lattice thermal conductivity (LTC) and related parameters for the zinc blende and wurtzite structure of InAs nanowires (NWs) with diameters of 50, 63, 66, 100 and 148 nm through the Morelli–Callaway model. For the model to be efficiently applicable, the longitudinal and transverse modes are considered. The melting point of the various-sized NWs is considered to estimate the Debye and phonon group velocities. The impacts of Grüneisen parameter, dislocations and surface roughness are also successfully utilized to address the calculated and measured LTC of the semiconductor under investigation. Results show that the Grüneisen parameter increases with decreasing NW diameter and that phonon confinement leads to an observable deviation of the calculated LTC curve from that of the experimental one in the case of bulk InAs. We assume that NW boundaries, dislocations and imperfections are responsible for the scattering of phonons along with electrons and other phonons because of normal and Umklapp processes. Therefore, at a specified temperature, LTC depends on the size and crystal structure of the semiconductor. As such, the thermal and mechanical parameters of InAs can be greatly modified by decreasing the size and dimension of the semiconductor as a result of the quantum-confinement effect.

中文翻译:

InAs 纳米线闪锌矿和纤锌矿结构的晶格热导率和相关参数的温度依赖性计算

通过 Morelli-Callaway 模型,对直径为 50、63、66、100 和 148 nm 的 InAs 纳米线 (NW) 的闪锌矿和纤锌矿结构的晶格热导率 (LTC) 和相关参数进行了理论计算。为了使模型有效地适用,考虑了纵向和横向模式。各种尺寸的 NW 的熔点被认为是估计德拜和声子群速度。Grüneisen 参数、位错和表面粗糙度的影响也成功地用于解决所研究半导体的计算和测量 LTC。结果表明,Grüneisen 参数随着 NW 直径的减小而增加,并且声子限制导致计算出的 LTC 曲线与散装 InAs 的实验曲线的可观察偏差。我们假设 NW 边界、位错和缺陷是由于正常和 Umklapp 过程导致声子与电子和其他声子一起散射的原因。因此,在指定温度下,LTC 取决于半导体的尺寸和晶体结构。因此,由于量子限制效应,可以通过减小半导体的尺寸和尺寸来极大地改变 InAs 的热和机械参数。由于正常过程和 Umklapp 过程,位错和缺陷是声子与电子和其他声子一起散射的原因。因此,在指定温度下,LTC 取决于半导体的尺寸和晶体结构。因此,由于量子限制效应,可以通过减小半导体的尺寸和尺寸来极大地改变 InAs 的热和机械参数。由于正常过程和 Umklapp 过程,位错和缺陷是声子与电子和其他声子一起散射的原因。因此,在指定温度下,LTC 取决于半导体的尺寸和晶体结构。因此,由于量子限制效应,可以通过减小半导体的尺寸和尺寸来极大地改变 InAs 的热和机械参数。
更新日期:2020-01-24
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