Tilting crystals to proper zone axes is a necessary but tedious work in taking selected area electron diffraction patterns (SAED) and high-resolution images using transmission electron microscope (TEM). This process not only costs a lot of time but also limits the application of TEM in electron-beam sensitive materials. Therefore, it is desirable to develop a simple method for tilting crystals from random orientations to a specific zone axis quickly. Herein, we describe a novel program, Zones, which can index the electron diffraction pattern and calculate the tilting angles of a double-tilt sample holder from the current orientation to a desired zone axis. It can also bring crystals that are slightly deviated from a zone axis to the exact zone with the help of Laue ring in the diffraction pattern. This program has been successfully applied to studies of zeolites and metal-organic frameworks (MOFs), known as being electron-beam sensitive. The program shows its power not only in saving the operator's time but also in preventing the crystals from quick beam damages.

中文翻译：

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一个用于将电子束敏感晶体快速倾斜到区域轴的简单程序

将晶体倾斜到适当的区轴是使用透射电子显微镜 (TEM) 获取选定区域电子衍射图 (SAED) 和高分辨率图像的必要但繁琐的工作。这一过程不仅耗费大量时间，而且限制了 TEM 在电子束敏感材料中的应用。因此，需要开发一种简单的方法来快速将晶体从随机取向倾斜到特定的区域轴。在这里，我们描述了一个新程序 Zones，它可以索引电子衍射图案并计算双倾斜样品架从当前方向到所需区域轴的倾斜角度。借助衍射图案中的劳厄环，它还可以将稍微偏离区域轴的晶体带到精确区域。该程序已成功应用于沸石和金属有机骨架 (MOF) 的研究，被称为电子束敏感。该程序不仅可以节省操作员的时间，还可以防止晶体受到光束的快速损坏。