Understanding and utilizing novel antiferromagnetic (AFM) materials has been recently one of the central issues in condensed matter physics, as well as in materials science and engineering. The relevant contemporary topics include multiferroicity, topological magnetism and AFM spintronics. The ability to image magnetic domains in AFM materials is of key importance for the success of these exciting fields. While imaging techniques of magnetic domains on the surfaces of ferro-(ferri)magnetic materials with, for example, magneto-optical Kerr microscopy and magnetic force microscopy have been available for a number of decades, AFM domain imaging is a relatively new development. We review various experimental techniques utilizing scanning, optical, and synchrotron X-ray probes to visualize AFM domains and domain walls, and to unveil their physical properties. We also discuss the existing challenges and opportunities in these techniques, especially with further increase of spatial and temporal resolution.

最近，了解和利用新型反铁磁（AFM）材料已成为凝聚态物理以及材料科学和工程学的中心问题之一。相关的当代主题包括多铁性，拓扑磁性和AFM自旋电子学。对AFM材料中的磁畴成像的能力对于这些令人兴奋的领域的成功至关重要。尽管使用磁光克尔显微镜和磁力显微镜对铁（铁）磁性材料表面的磁畴成像技术已有数十年的历史了，但AFM磁畴成像却是一个相对较新的发展。我们回顾了利用扫描，光学和同步加速器X射线探针观察AFM域和域壁的各种实验技术，并揭示它们的物理特性。我们还将讨论这些技术中存在的挑战和机遇，尤其是随着时空分辨率的进一步提高。