Here the fabrication of an inorganic metal‐halide perovskite CsPbBr₃ based X‐ray detector is reported utilizing a simple, scalable, and cost‐sensitive melt processing directly on substrate of any size. X‐ray diffraction analysis on the several 100 mm thick melt processed films confirms crystalline domains in the cm² range. The CsPbBr₃ film features a resistance of 8.5 GΩ cm and a hole mobility of 18 cm² V⁻¹ s⁻¹. An X‐ray to current conversion rate of 1450 mC Gy_air⁻¹ cm⁻² at an electric field of 1.2 × 10⁴ V cm⁻¹ and a detection limit in the sub µGy_air s⁻¹ regime is demonstrated. The high crystallinity and chemical purity of the melt processed CsPbBr₃ films are suggested to be responsible for a performance which is on par to current state‐of‐the‐art Cd(Zn)Te based X‐ray detector technology.

中文翻译：

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利用可伸缩熔体加工制造的结晶CsPbBr3钙钛矿薄膜的灵敏直接转换X射线探测器

在此报道了基于无机金属卤化物钙钛矿基于CsPbBr ₃的X射线检测器的制造，该检测器直接在任何尺寸的基板上利用简单，可扩展且成本敏感的熔融工艺进行制造。在几幅100毫米厚的熔融加工薄膜上进行X射线衍射分析，确认了在cm ²范围内的晶畴。CsPbBr ₃膜的电阻为8.5GΩcm ，空穴迁移率为18cm ² V ^-1 s ^-1。在1.2×10 ⁴ V cm ^-1的电场下，X射线到电流的转换速率为1450 mC Gy_空气^-1 cm ^-2，检测极限在亚µ级显示了Gy _air s ^-1态。熔融处理的CsPbBr ₃膜的高结晶度和化学纯度被认为与目前基于Cd（Zn）Te的X射线检测器技术相媲美。