Abstract The three-dimensional gap distribution and area of true contact significantly affect sealing performance and tribological properties between rough surfaces. Current experimental approaches are limited in their ability to predict the evolution of the gap distribution and real contact area on assembled rough interfaces, particularly on non-transparent surfaces. In our previous study [1], we presented a X-ray computed tomography method to obtain these parameters between non-transparent assembled rough interfaces experimentally. In this study, contacts of higher complexity than in our previous work are studied and accuracy as well as limitations of the experimental method are discussed. Additionally, the experimental procedure and data-processing methods are detailed to help other researchers reproduce this work.

中文翻译：

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探讨 X 射线计算机断层扫描在接触力学研究中的能力

摘要 三维间隙分布和真实接触面积显着影响粗糙表面之间的密封性能和摩擦学性能。当前的实验方法在预测组装粗糙界面上的间隙分布和实际接触面积的演变方面的能力有限，特别是在非透明表面上。在我们之前的研究 [1] 中，我们提出了一种 X 射线计算机断层扫描方法，以通过实验获得非透明组装粗糙界面之间的这些参数。在这项研究中，研究了比我们以前的工作更复杂的接触，并讨论了实验方法的准确性和局限性。此外，详细的实验程序和数据处理方法可以帮助其他研究人员重现这项工作。