Abstract In this research, a novel, precise and cost-effective method of 2-dimensional (2D) temperature measurement based on lifetime technique is introduced without using a high-speed camera. The setup is simple and includes only a blue excitation light-emitting-diode (LED) and a low frame-rate CMOS camera. Instead of multiple frame capturing techniques in a single decay curve, the proposed technique takes a single image per excitation pulse in a stroboscopic mode. Two-dimensional thermographic imaging of a printed circuit board as a test sample was done based on the transient luminescence characteristics of magnesium fluoro-germanate (MFG) thermographic phosphor (TP). A cost effective, blue LED (425 nm) excitation source was used to illuminate the circuit board at a repetition rate of 33.33 Hz. The integration time of the camera was 10 ms and the detection window was applied after turning off the LEDs with an increasing delay during the successive periods. 100 pictures covering 4 milliseconds of the decay curve were then used to calculate the lifetime and temperature of each pixel of the image of the circuit board. Combined pixel-to-pixel and shot-to-shot uncertainty was only ±2.5 °C with a high spatial resolution of 50 µm.

中文翻译：

---

使用低帧率 CMOS 相机通过衰减时间法进行新型二维荧光热成像

摘要 在这项研究中，介绍了一种基于寿命技术的新型、精确且经济的二维 (2D) 温度测量方法，无需使用高速相机。设置很简单，只包括一个蓝色激发发光二极管 (LED) 和一个低帧率 CMOS 相机。所提出的技术不是在单个衰减曲线中使用多帧捕获技术，而是在频闪模式下对每个激发脉冲拍摄单个图像。基于氟锗酸镁 (MFG) 热成像磷光体 (TP) 的瞬态发光特性，对作为测试样品的印刷电路板进行二维热成像。使用具有成本效益的蓝色 LED (425 nm) 激发源以 33.33 Hz 的重复频率照亮电路板。相机的积分时间为 10 ms，检测窗口在关闭 LED 后应用，在连续时间段内延迟增加。然后使用覆盖 4 毫秒衰减曲线的 100 张图片来计算电路板图像的每个像素的寿命和温度。像素到像素和镜头到镜头的组合不确定度仅为 ±2.5 °C，具有 50 µm 的高空间分辨率。